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- IEC Test Probe
- UL Test Probe
- Material Flammability Tester
- IP Code Tester
- Impact Test Apparatus
- Security Testing Machine
- Lamp Cap Gauge Tester
- Lampholders Gauge Tester
- Plug & Socket Tester
- Electrical Safety Tester
- LED Test Instruments
- Environmental Test Equipment
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- Weighing Sensor
- Others Testing Equipment
technical articles
Fun ptoduct
- CEI IEC 60884-1 Figure 10 Socket-outlets Protection Test Probe with 1N Force
- Item LX-1N
CEI IEC 60884-1 Figure 10 Socket-outlets Protection Test Probe with 1N Force
To calibrate the gauge, a push force of 1 N is applied on the steel rigid wire in the direction of its axis:
the characteristics of the gauge internal spring shall be such that the surface A – A′ is brought practically to the same level as the surface B – B′ when this force is applied.
Figure 10 – Gauge for checking non-accessibility of live parts, through shutters, and of live parts of socket-outlets with increased protection
Shenzhen Julixing Instruments Co., Ltd. are specialized in manufacturing
special, custom built, test and measuring equipment for products testing as per international norms and
offering calibration services and related information. Our products and services are used by research & development
establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients'
requirements.
If you require equipment to
test products such as home appliances, electrical accessories like switches, sockets, connectors, etc.
industrial & road lighting luminaires, automobile lighting systems or related
categories, we can provide the solutions you need.
We would appreciate your comments on the layout design,
presentation or other aspects of our website.
Website: http://www.china-item.com
Contacts: Eason Wang
E-mail: sales@china-item.com
TEL: +86-755-33168386
Phone: +86-13751010017
SKYPE: carlisle.wyk
TradeManager: cn112384072
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
ZIP: 518102
Website: http://www.china-item.com/
- UL 1205 / IEC 60475 / IEC 60335-1 Figure 7 - Test Finger Nail with 30N Force Gauges
- UL6500 Figure B.1 / IEC60950-1 Figure 2C - Test Probe Telekom Sonde
- IEC61032:1997 / IEC61032:2008 / BS EN61032 / CEI 61032 IP1X Test Probe A with 50N Force
- IEC 60529 Probe Test B with 10N Force for IPX Test Equipment