Julixing Instruments

Julixing Instruments

 
Julixing Instruments

contact us

tel +86-755-33168386
+86-755-61605199
email

info@china-item.com

sales@china-item.com

contact us


 

Fun ptoduct

Test Probe B of IEC 61032 with 125mm * 80mm Circular Stop Face of IEC 60335-2-14: 2006 +A1:2008+A2:2012 (Ed.5.2)
  • prev
  • Next

     
    
     

Subject: Application of test probe to blenders.

Question: Which test probe is correct to check the protection for moving parts of blenders according to clause 20.2?

The clarification of the length of the stop face is necessary, due to its influences on the test result.

Decision:
The test probe is identical to test probe B of IEC 61032 except that the diameter of a circular stop face is 125 mm and a distance between the tip of the test finger and the stop face is 100 mm as follows;

Explanatory notes:
The decision was taken based on the OSM HA 466 in 2011 and confirmed by IEC/TC61Portoroz meeting in 2013.

IECEE-CTL DSH 1075 20140812_1.jpg



Company introduction


Shenzhen Julixing Instruments Co., Ltd.
are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.


If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.


We would appreciate your comments on the layout design, presentation or other aspects of our website.

Website: http://www.china-item.com


Contact information


Contacts:
Eason Wang

E-mail: sales@china-item.com

TEL: +86-755-33168386

Phone: +86-13751010017

SKYPE: carlisle.wyk

TradeManager: cn112384072

Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China

ZIP: 518102

Website: http://www.china-item.com/

test probe

laboratory 
equipment

spring impact 
hammerhipot testerfinger probe testtest probe pin	
probetest equipmentglow wire testerimpact test hammer

    Standard:       IEC 61032 IEC 60061 IEC 60335 IEC 60529 IEC 60068 IEC 60695 VDE 0620 UL AS/NZS3112
    TAG:
IEC Test Probe Go No Go Gauge Spring Impact Hammer Integrating Sphere UL Probe Test IP Tester Test Equipment
 
Glow Wire Tester Impact Test Hammer Go Gauge UL Test Finger Probe Hipot Tester Test Probe Needle Impact Testing Machine
  Español   Español Svenska   Svenska لعربية   لعربية русский   русский Português   Português 中国  中国 Polski   Polski Română   Română Dansk   Dansk suomi   suomi
  Français   Français hrvatski   hrvatski Ελληνικά   Ελληνικά Nederlands   Nederlands česky   česky Deutsch   Deutsch 日本の   日本の Italia   Italia български   български นไทย   นไทย
test probe